SKU: 1018820
Category
£889
Delivery: 9-13 working days 9-13 working days Out of stock
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      Description

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      Optical sensor for investigating distribution of light intensity. Particularly well suited for the investigation of light diffraction at single slits, multiple slits or diffraction gratings. User-friendly measurement and evaluation software enable simultaneous recording and analysis in real-time. The built-in software for Windows 2000/XP/Vista/7/8 32- and 64-bit versions starts running as soon as the sensor is connected to the computer via a USB cable. Includes attenuating filter, stand rod and plug-in power supply.

      Software:
      Data acquisition possible in two modes:
      Intensity as a function of location, e.g. for diffraction and interference.
      Intensity in a region as a function of time.
      Pointer mode, model calculation mode, spreadsheet and report modes are all available for the purposes of evaluation.
       
      Sensor:                                 Toshiba 3648 pixel SWB
      Resolution:                           16 bits
      Integration time:                   0.1 ms to 6.5 s
      Filter attachment:                Clix (magnetic ring)
      Sensitive surface of sensor:         8 µm x 30 mm
      Interface:                               USB 2.0

       
      Experiment Topics:

      ·         Measurement and calculations for models of diffraction at a single slit, multiple slit and diffraction gratings.
      ·         Interference.
      ·         Fluctuations in intensity
       
       
      Advantages:

      ·         Plug & play: no software installation or drivers required.
      ·         Measurement and evaluation in real-time.
      ·         Simple and practical software with built-in wizards and powerful evaluation function.
      ·         Spectra of high quality and signal stability
      ·         Low noise
      ·         High resolution
      ·         Suitable for measuring very slight fluctuations in intensity with very high precision.
      Measurement of second-order diffraction without saturation of the first order.

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